default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDTerumine Hayashi
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2000 – 2009
- 2009
[c24]Haruhiko Takase, Masaru Fujita, Hiroharu Kawanaka, Shinji Tsuruoka, Hidehiko Kita, Terumine Hayashi:
Obstacle to training SpikeProp networks - Cause of surges in training process -. IJCNN 2009: 3062-3066- 2008
- [c23]Masaru Fujita, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi:
Shape of error surfaces in SpikeProp. IJCNN 2008: 840-844 - 2007
- [c22]Kazutaka Noro, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi, Naoki Morita:
Descriptive Answer Clustering System for Immediate Feedback. ICCE 2007: 37-40 - [c21]Haruhiko Takase, Masahiko Masahiko, Hidehiko Kita, Terumine Hayashi:
Enhancing both generalization and fault tolerance of multilayer neural networks. IJCNN 2007: 1429-1433 - 2006
- [c20]Terumine Hayashi, Naotsugu Ikeda, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita:
Low Power Oriented Test Modification and Compression Techniques for Scan Based Core Testing. ATS 2006: 327-332 - [c19]Haruhiko Takase, Hidehiko Kita, Terumine Hayashi:
Fault tolerant training algorithm for multi-layer neural networks focused on hidden unit activities. IJCNN 2006: 1540-1545 - 2005
- [j4]Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase:
On Test Data Compression Using Selective Don't-Care Identification. J. Comput. Sci. Technol. 20(2): 210-215 (2005) - [c18]Tsuyoshi Shinogi, Hiroyuki Yamada, Terumine Hayashi, Shinji Tsuruoka, Tomohiro Yoshikawa:
A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture. Asian Test Symposium 2005: 366-371 - 2004
- [c17]Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase:
Test data compression technique using selective don't-care identification. ASP-DAC 2004: 230-233 - 2003
- [c16]Tsuyoshi Shinogi, Yuki Yamada, Terumine Hayashi, Tomohiro Yoshikawa, Shinji Tsuruoka:
Between-Core Vector Overlapping for Test Cost Reduction in Core Testing. Asian Test Symposium 2003: 268-273 - [c15]Yusei Katsuda, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi:
Manipulation of hidden units activities for fault tolerant multi-layer neural networks. CIRA 2003: 19-24 - 2001
- [j3]Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi:
An enhanced fault model for high defect coverage. Syst. Comput. Jpn. 32(6): 36-44 (2001) - [c14]Tsuyoshi Shinogi, Tomokazu Kanbayashi, Tomohiro Yoshikawa, Shinji Tsuruoka, Terumine Hayashi:
Faulty Resistance Sectioning Technique for Resistive Bridging Fault ATPG Systems. Asian Test Symposium 2001: 76-81 - 2000
- [c13]Tsuyoshi Shinogi, Masahiro Ushio, Terumine Hayashi:
Cyclic greedy generation method for limited number of IDDQ tests. Asian Test Symposium 2000: 362- - [c12]Haruhiko Takase, Tsuyoshi Shinogi, Terumine Hayashi, Hidehiko Kita:
Evaluation Function for Fault Tolerant Multi-Layer Neural Networks. IJCNN (3) 2000: 521-526
1990 – 1999
- 1999
- [j2]Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki:
Test generation for stuck-on faults in pass-transistor logic SPL and implementation of DFT circuits. Syst. Comput. Jpn. 30(7): 55-68 (1999) - [c11]Kai Zhang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi:
A Method for Evaluating Upper Bound of Simultaneous Switching Gates Using Circuit Partition. ASP-DAC 1999: 291-294 - [c10]Tsuyoshi Shinogi, Terumine Hayashi:
A Parallel Generation System of Compact IDDQ Test Sets for Large Combinational Circuits. Asian Test Symposium 1999: 164- - 1998
- [c9]Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi:
On a Logical Fault Model H1SGLF for Enhancing Defect Coverage. Asian Test Symposium 1998: 102-107 - [c8]Tsuyoshi Shinogi, Terumine Hayashi:
A Simple and Efficient Method for Generating Compact IDDQ Test Set for Bridging Fault. VTS 1998: 112-117 - 1997
- [c7]Kai Zhang, Haruhiko Takase, Terumine Hayashi, Hidehiko Kita:
An enhanced iterative improvement method for evaluating the maximum number of simultaneous switching gates for combinational circuits. ASP-DAC 1997: 107-112 - [c6]Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki:
Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL. Asian Test Symposium 1997: 16-21 - 1993
- [j1]Kazunori Hikone, Mitsuji Ikeda, Kazumi Hatayama, Terumine Hayashi:
Sequential circuit test generation by real number simulation. Syst. Comput. Jpn. 24(9): 64-75 (1993) - 1992
- [c5]Kazumi Hatayama, Kazunori Hikone, Mitsuji Ikeda, Terumine Hayashi:
Sequential Test Generation Based on Real-Value Logic. ITC 1992: 41-48 - 1991
- [c4]Yutaka Sekiyama, Yasuyuki Fujihara, Terumine Hayashi, Mitsuho Seki, Jiro Kusuhara, Kazuhiko Iijima, Masahiro Takakura, Koji Fukatani:
Timing-Oriented Routers for PCB Layout Design of High-Performance Computers. ICCAD 1991: 332-335 - 1990
- [c3]Hiroshi Date, Mitsuho Seki, Terumine Hayashi:
LSI module placement methods using neural computation networks. IJCNN 1990: 831-836
1980 – 1989
- 1989
- [c2]Kazumi Hatayama, Mitsuji Ikeda, Terumine Hayashi, Masahiro Takakura, Kuniaki Kishida, Shun Ishiyama:
Enhanced Delay Test Generator for High-Speed Logic LSIs. ITC 1989: 161-165 - 1986
- [c1]Kuniaki Kishida, F. Shirotori, Y. Ikemoto, Shun Ishiyama, Terumine Hayashi:
A delay test system for high speed logic LSI's. DAC 1986: 786-790
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:53 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
