default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDJerry M. Soden
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2000 – 2009
- 2002
[c17]Jaume Segura
, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins:
Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC 2002: 90-99- [c16]Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura:
Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. ITC 2002: 947-953 - 2001
- [c15]Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden:
Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. VTS 2001: 286-291
1990 – 1999
- 1999
- [j9]Charles F. Hawkins, Jerry M. Soden:
Deep Submicron CMOS Current IC Testing: Is There a Future? IEEE Des. Test Comput. 16(4): 14-15 (1999) - [j8]Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin:
Test and Reliability: Partners in IC Manufacturing, Part 2. IEEE Des. Test Comput. 16(4): 66-73 (1999) - 1998
- [c14]Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell:
CMOS IC reliability indicators and burn-in economics. ITC 1998: 194-203 - 1997
- [j7]Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson:
IC Failure Analysis: Magic, Mystery, and Science. IEEE Des. Test Comput. 14(3): 59-69 (1997) - [j6]Jerry M. Soden, Christopher L. Henderson:
Still in the Stone Age? IEEE Des. Test Comput. 14(3): 128- (1997) - [c13]Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins:
Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. ITC 1997: 23-31 - [c12]Christopher L. Henderson, Jerry M. Soden:
Signature Analysis for IC Diagnosis and Failure Analysis. ITC 1997: 310-318 - [c11]Jerry M. Soden, Christopher L. Henderson:
IC Diagnosis: Industry Issues. ITC 1997: 435 - 1996
- [j5]Jerry M. Soden, Charles F. Hawkins:
IDDQ Testing: Issues Present and Future. IEEE Des. Test Comput. 13(4): 61-65 (1996) - [c10]Alan W. Righter, Jerry M. Soden, Richard W. Beegle:
High Resolution IDDQ Characterization and Testing - Practical Issues. ITC 1996: 259-268 - [c9]Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson:
IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. ITC 1996: 935 - 1995
- [j4]Charles F. Hawkins, Jerry M. Soden:
IDDQ Design and Test Advantages Propel Industry. IEEE Des. Test Comput. 12(2): 40-41 (1995) - 1994
- [c8]Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson:
Defect Classes - An Overdue Paradigm for CMOS IC. ITC 1994: 413-425 - 1993
- [j3]Jerry M. Soden, Richard E. Anderson:
IC failure analysis: techniques and tools for quality reliability improvement. Proc. IEEE 81(5): 703-715 (1993) - [c7]Jerry M. Soden, Charles F. Hawkins:
Quality Testing Requires Quality Thinking. ITC 1993: 596 - 1992
- [j2]Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao:
IDDQ testing: A review. J. Electron. Test. 3(4): 291-303 (1992) - 1991
- [c6]Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins:
The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. ITC 1991: 302-310 - 1990
- [c5]Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins:
Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ. ITC 1990: 255-256 - [c4]Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins:
Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets. ITC 1990: 427-435
1980 – 1989
- 1989
- [c3]Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins:
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. ITC 1989: 423-430 - 1986
- [j1]Jerry M. Soden, Charles F. Hawkins:
Test Considerations for Gate Oxide Shorts in CMOS ICs. IEEE Des. Test 3(4): 56-64 (1986) - [c2]Jerry M. Soden, Charles F. Hawkins:
Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. ITC 1986: 443-451 - 1985
- [c1]Jerry M. Soden, Charles F. Hawkins:
Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. ITC 1985: 544-557
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:59 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
