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Johann Alsmeier

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2020 – today

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2022
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  - conf/imw2/ChuRZAS22
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Weishen Chu, Seyyed Ehsan Esfahani Rashidi, Yanli Zhang, Johann Alsmeier, Toshiyuki Sega:
An Analytical Model for Thin Film Pattern-dependent Asymmetric Wafer Warpage Prediction. IMW 2022: 1-4

2000 – 2009

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2000
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Heinz Hoenigschmid, Alexander Frey, John K. DeBrosse, Toshiaki Kirihata, Gerhard Mueller, Daniel W. Storaska, Gabriel Daniel, Gerd Frankowsky, Kevin P. Guay, David R. Hanson, Louis Lu-Chen Hsu, Brian Ji, Dmitry G. Netis, Steve Panaroni, Carl Radens, Armin M. Reith, Hartmud Terletzki, Oliver Weinfurtner, Johann Alsmeier, Werner Weber, Matthew R. Wordeman:
A 7F² cell and bitline architecture featuring tilted array devices and penalty-free vertical BL twists for 4-Gb DRAMs. IEEE J. Solid State Circuits 35(5): 713-718 (2000)

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