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Jaeheon Noh

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2010 – 2019

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2018
[c1]
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  dblp key:
  - conf/irps/JiKKLNJSKHCSPCD18
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  - https://dblp.org/rec/conf/irps/JiKKLNJSKHCSPCD18
Younggeun Ji, Jeonghoon Kim, Jungin Kim, Miji Lee, Jaeheon Noh, Taeyoung Jeong, Juhyeon Shin, Junho Kim, Young Heo, Ung Cho, Hyun-Chul Sagong, Junekyun Park, Yeonsik Choo, Gilhwan Do, Hoyoung Kang, Eunkyeong Choi, Dongyoon Sun, Changki Kang, Sangchul Shin, Sangwoo Pae:
Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI. IRPS 2018: 3

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