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2020 – today
- 2023
[j20]Xuerong Ye, Qisen Sun
, Wenwen Li, Guofu Zhai:
Life prediction of lithium thionyl chloride batteries based on the pulse load test and accelerated degradation test. Qual. Reliab. Eng. Int. 39(8): 3335-3349 (2023)- [j19]Cen Chen, Chengzhi Sun, Liqin Wu, Xuerong Ye, Guofu Zhai:
Model-based quality consistency analysis of permanent magnet synchronous motor cogging torque in wide temperature range. Qual. Reliab. Eng. Int. 39(8): 3502-3517 (2023) - [j18]Bokai Zheng, Cen Chen, Yigang Lin, Xuerong Ye, Guofu Zhai:
Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate. IEEE Trans. Reliab. 72(1): 37-48 (2023) - 2022
- [j17]Bokai Zheng, Cen Chen, Yigang Lin, Yifan Hu, Xuerong Ye, Guofu Zhai, Enrico Zio:
Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process. Reliab. Eng. Syst. Saf. 217: 108087 (2022) - [j16]Xuerong Ye, Yifan Hu, Bokai Zheng, Cen Chen, Guofu Zhai:
A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling. Reliab. Eng. Syst. Saf. 228: 108815 (2022) - 2021
- [j15]Cen Chen, Yun Yang, Xuerong Ye, Guofu Zhai:
Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary. IEEE Access 9: 16019-16029 (2021) - [j14]Guofu Zhai, Bokai Zheng, Xuerong Ye, Shuang Si, Enrico Zio:
A failure mechanism consistency test method for accelerated degradation test. Qual. Reliab. Eng. Int. 37(2): 464-483 (2021) - [j13]Xuerong Ye, Hao Chen, Cen Chen, Guofu Zhai:
Life-Cycle Dynamic Robust Design Optimization for Batch Production of Permanent Magnet Actuator. IEEE Trans. Ind. Electron. 68(10): 9885-9896 (2021) - [j12]Xuerong Ye, Yifan Hu, Junxian Shen, Cen Chen, Guofu Zhai:
An Adaptive Optimized TVF-EMD Based on a Sparsity-Impact Measure Index for Bearing Incipient Fault Diagnosis. IEEE Trans. Instrum. Meas. 70: 1-11 (2021) - [c1]Yun Yang, Cen Chen, Xuerong Ye, Chengzhi Sun:
An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation. I2MTC 2021: 1-6 - 2020
- [j11]Xuerong Ye, Yifan Hu, Junxian Shen, Rui Feng, Guofu Zhai:
An Improved Empirical Mode Decomposition Based on Adaptive Weighted Rational Quartic Spline for Rolling Bearing Fault Diagnosis. IEEE Access 8: 123813-123827 (2020)
2010 – 2019
- 2018
- [j10]Xuerong Ye, Cen Chen, Myeongsu Kang, Guofu Zhai, Michael G. Pecht:
A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests. IEEE Access 6: 42566-42577 (2018) - [j9]Xuerong Ye, Cen Chen, Yixing Wang, L. Wang, Guofu Zhai:
VDMOSFET HEF degradation modelling considering turn-around phenomenon. Microelectron. Reliab. 80: 37-41 (2018) - [j8]Xuerong Ye, Yigang Lin, Qingmin Wang, Hao Niu, Guofu Zhai:
Manufacturing process-based storage degradation modelling and reliability assessment. Microelectron. Reliab. 88-90: 107-110 (2018) - [j7]Xuerong Ye, Cen Chen, Guofu Zhai:
Fault localization of a switched mode power supply based on extended integer-coded dictionary method. Microelectron. Reliab. 88-90: 339-344 (2018) - [j6]Hao Niu, Shujuan Wang, Xuerong Ye, Huai Wang, Frede Blaabjerg:
Lifetime prediction of aluminum electrolytic capacitors in LED drivers considering parameter shifts. Microelectron. Reliab. 88-90: 453-457 (2018) - [j5]Xuerong Ye, Kaixin Zhang, Cen Chen, Zhongwei Li, Yue Wang, Guofu Zhai:
The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress. Microelectron. Reliab. 91: 46-51 (2018) - 2015
- [j4]Guofu Zhai, Yuege Zhou, Xuerong Ye:
A Tolerance Design Method for Electronic Circuits Based on Performance Degradation. Qual. Reliab. Eng. Int. 31(4): 635-643 (2015) - 2011
- [j3]Xuerong Ye, Jie Deng, Qiong Yu, Guofu Zhai:
Failure Process and Dynamic Reliability Estimation of Sealed Relay. IEICE Trans. Electron. 94-C(9): 1375-1380 (2011)
2000 – 2009
- 2009
- [j2]Xuerong Ye, Huimin Liang, Jie Deng, Guofu Zhai:
Research on Dynamic Characteristics Testing and Analyzing System of Electromagnetic Relay. IEICE Trans. Electron. 92-C(8): 1028-1033 (2009) - 2006
- [j1]Huimin Liang, Xuerong Ye, Guofu Zhai:
Research on the Tolerance Distribution of Sealed Electromagnetic Relay with Reliability Index. IEICE Trans. Electron. 89-C(8): 1164-1172 (2006)
Coauthor Index
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