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ORCIDRyo Kishida
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2020 – today
- 2024
[c12]Reo Nagasue, Isamu Mizuno, Ryo Kishida, Tatsuya Iwata, Takefumi Yoshikawa:
A Fractional-N PLL for Multi-phase Clock Generation with Loop Bandwidth Enhancement. ISCAS 2024: 1-5- 2023
- [c11]Daisuke Kikuta, Ryo Kishida, Kazutoshi Kobayashi:
Ring Oscillators with identical Circuit Structure to Measure Bias Temperature Instability. ASICON 2023: 1-4 - 2022
- [c10]Ikuo Suda, Ryo Kishida, Kazutoshi Kobayashi:
An Aging Degradation Suppression Scheme at Constant Performance by Controlling Supply Voltage and Body Bias in a 65 nm Fully-Depleted Silicon-On-Insulator Process. IRPS 2022: 4-1 - 2021
- [j4]Satoshi Sekine, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo:
Digital Calibration Algorithm of Conversion Error Influenced by Parasitic Capacitance in C-C SAR-ADC Based on γ-Estimation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 104-A(2): 516-524 (2021) - [c9]Ryo Kishida, Ikuo Suda, Kazutoshi Kobayashi:
Bias Temperature Instability Depending on Body Bias through Buried Oxide (BOX) Layer in a 65 nm Fully-Depleted Silicon-On-Insulator Process. IRPS 2021: 1-6 - 2020
- [j3]Takumi Hosaka, Shinichi Nishizawa
, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi:
Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement. IPSJ Trans. Syst. LSI Des. Methodol. 13: 56-64 (2020)
2010 – 2019
- 2019
- [c8]Takuya Asuke, Ryo Kishida, Jun Furuta, Kazutoshi Kobayashi:
Temperature Dependence of Bias Temperature Instability (BTI) in Long-term Measurement by BTI-sensitive and -insensitive Ring Oscillators Removing Environmental Fluctuation. ASICON 2019: 1-4 - [c7]Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi:
Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. IOLTS 2019: 305-309 - [c6]Yuichiro Kobayashi, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo:
Investigation of Hybrid ADC Combined with First-order Feedforward Incremental and SAR ADCs. ISPACS 2019: 1-2 - [c5]Yuki Tanaka, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo:
Duty Ratio and Capacitance Analysis of AC/DC Converter without Current Control Circuit. ISPACS 2019: 1-2 - [c4]Yuichiro Unno, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo:
Examination of Incremental ADC with SAR ADC to Reduce Conversion Time with High Accuracy. ISPACS 2019: 1-2 - 2018
- [c3]Satoshi Sekine, Tatsuji Matsuura, Ryo Kishida, Akira Hyogo:
A Novel C-2αC Ladder Based Non-binary DAC for SAR-ADC Using Unit Capacitors. ISPACS 2018: 457-462 - 2017
- [j2]Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi:
Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 100-A(12): 2758-2763 (2017) - [c2]Takuya Komawaki, Michitarou Yabuuchi, Ryo Kishida, Jun Furuta, Takashi Matsumoto, Kazutoshi Kobayashi:
Circuit-level simulation methodology for Random Telegraph Noise by using Verilog-AMS. ICICDT 2017: 1-4 - 2015
- [c1]Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi:
Negative bias temperature instability caused by plasma induced damage in 65 nm bulk and Silicon on thin BOX (SOTB) processes. IRPS 2015: 2 - 2014
- [j1]Michitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi:
Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 97-A(12): 2367-2372 (2014)
Coauthor Index
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