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ORCIDInnocent Agbo
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2020 – today
- 2020
[c15]Innocent Agbo, Alexander V. Kupriyanov
, Igor Rytsarev:
Big Data Architecture: Designing the Right Solution for Social Network Analysis. ISDFS 2020: 1-5
2010 – 2019
- 2019
- [j4]Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. 27(6): 1308-1321 (2019) - [c14]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Methodology for Application-Dependent Degradation Analysis of Memory Timing. DATE 2019: 162-167 - [c13]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. ETS 2019: 1-6 - [c12]Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui:
Reliability Modeling and Mitigation for Embedded Memories. ITC 2019: 1-10 - [c11]Daniel H. P. Kraak, Cemil Cem Gürsoy, Innocent O. Agbo, Mottaqiallah Taouil, Maksim Jenihhin, Jaan Raik, Said Hamdioui:
Software-Based Mitigation for Memory Address Decoder Aging. LATS 2019: 1-6 - 2018
- [j3]Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Impact and mitigation of SRAM read path aging. Microelectron. Reliab. 87: 158-167 (2018) - [c10]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Degradation analysis of high performance 14nm FinFET SRAM. DATE 2018: 201-206 - 2017
- [j2]Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1444-1454 (2017) - [j1]Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. IEEE Trans. Very Large Scale Integr. Syst. 25(12): 3464-3472 (2017) - [c9]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Mitigation of sense amplifier degradation using input switching. DATE 2017: 858-863 - 2016
- [c8]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor:
Comparative BTI analysis for various sense amplifier designs. DDECS 2016: 68-73 - [c7]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Read path degradation analysis in SRAM. ETS 2016: 1-2 - [c6]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene:
Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. ISVLSI 2016: 725-730 - 2015
- [c5]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Stefan Cosemans, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. DTIS 2015: 1-6 - [c4]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
BTI analysis of SRAM write driver. IDT 2015: 100-105 - [c3]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. VTS 2015: 1-6 - 2014
- [c2]Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor:
Bias Temperature Instability analysis of FinFET based SRAM cells. DATE 2014: 1-6 - 2013
- [c1]Innocent Agbo, Seyab Khan, Said Hamdioui:
BTI impact on SRAM sense amplifier. IDT 2013: 1-6
Coauthor Index
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