default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDNarendra Devta-Prasanna
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2014
[p2]Sandeep Kumar Goel, Narendra Devta-Prasanna:
Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2014: 147-160- [p1]Narendra Devta-Prasanna, Sandeep Kumar Goel:
Small-Delay Defect Coverage Metrics. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2014: 185-210 - 2012
- [c20]Sreejit Chakravarty, Narendra Devta-Prasanna, Arun Gunda, Junxia Ma, Fan Yang, H. Guo, R. Lai, D. Li:
Silicon evaluation of faster than at-speed transition delay tests. VTS 2012: 80-85 - [c19]Wei Zhao, Sreejit Chakravarty, Junxia Ma, Narendra Devta-Prasanna, Fan Yang, Mohammad Tehranipoor:
A novel method for fast identification of peak current during test. VTS 2012: 191-196 - 2010
- [c18]Narendra Devta-Prasanna, Arun Gunda:
Clock Gate Test Points. ITC 2010: 84-93 - [c17]Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz:
Multiple fault activation cycle tests for transistor stuck-open faults. ITC 2010: 821
2000 – 2009
- 2009
- [c16]Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz:
Detectability of internal bridging faults in scan chains. ASP-DAC 2009: 678-683 - [c15]Fan Yang
, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz:
Improving the Detectability of Resistive Open Faults in Scan Cells. DFT 2009: 383-391 - [c14]Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy:
Accurate measurement of small delay defect coverage of test patterns. ITC 2009: 1-10 - [c13]Sandeep Kumar Goel, Narendra Devta-Prasanna, Mark Ward:
Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study. ITC 2009: 1-10 - [c12]Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia:
Effective and Efficient Test Pattern Generation for Small Delay Defect. VTS 2009: 111-116 - 2008
- [j2]Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda:
Comparative study of centralised and distributed compatibility-based test data compression. IET Comput. Digit. Tech. 2(2): 108-117 (2008) - [c11]Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz:
Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells. DFT 2008: 394-402 - [c10]Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz:
An Enhanced Logic BIST Architecture for Online Testing. IOLTS 2008: 10-15 - [c9]Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz:
Detection of Internal Stuck-open Faults in Scan Chains. ITC 2008: 1-10 - [c8]Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz:
On the Detectability of Scan Chain Internal Faults - An Industrial Case Study. VTS 2008: 79-84 - 2007
- [j1]Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda:
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(5): 907-918 (2007) - [c7]Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda:
Systematic Scan Reconfiguration. ASP-DAC 2007: 738-743 - 2006
- [c6]Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz:
Test Generation for Open Defects in CMOS Circuits. DFT 2006: 41-49 - [c5]Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz:
A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. ETS 2006: 185-192 - 2005
- [c4]Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz:
Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions. Asian Test Symposium 2005: 202-207 - [c3]Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda:
Should Illinois-Scan Based Architectures be Centralized or Distributed? DFT 2005: 406-414 - [c2]Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz:
A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. ICCD 2005: 471-474 - [c1]Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz:
Methods for improving transition delay fault coverage using broadside tests. ITC 2005: 10
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-10-07 21:19 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
