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Charles J. Burroughs Jr.
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2010 – 2019
- 2015
- [j25]Alain Rüfenacht, Logan A. Howe, Anna E. Fox, Robert E. Schwall, Paul D. Dresselhaus, Charles J. Burroughs Jr., Samuel P. Benz:
Cryocooled 10 V Programmable Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 64(6): 1477-1482 (2015) - 2013
- [j24]Alain Rüfenacht, Charles J. Burroughs Jr., Paul D. Dresselhaus, Samuel P. Benz:
Differential Sampling Measurement of a 7 V RMS Sine Wave With a Programmable Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 62(6): 1587-1593 (2013) - [j23]Charles J. Burroughs Jr., Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus:
Method for Ensuring Accurate AC Waveforms With Programmable Josephson Voltage Standards. IEEE Trans. Instrum. Meas. 62(6): 1627-1633 (2013) - 2011
- [j22]Piotr S. Filipski, Michael Boecker, Samuel P. Benz, Charles J. Burroughs Jr.:
Experimental Determination of the Voltage Lead Error in an AC Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 60(7): 2387-2392 (2011) - [j21]Charles J. Burroughs Jr., Paul D. Dresselhaus, Alain Rüfenacht, David Olaya, Michael M. Elsbury, Yi-Hua Tang, Samuel P. Benz:
NIST 10 V Programmable Josephson Voltage Standard System. IEEE Trans. Instrum. Meas. 60(7): 2482-2488 (2011)
2000 – 2009
- 2009
- [j20]Charles J. Burroughs Jr., Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus:
Systematic Error Analysis of Stepwise-Approximated AC Waveforms Generated by Programmable Josephson Voltage Standards. IEEE Trans. Instrum. Meas. 58(4): 761-767 (2009) - [j19]Alain Rüfenacht, Charles J. Burroughs Jr., Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson:
Precision Differential Sampling Measurements of Low-Frequency Synthesized Sine Waves With an AC Programmable Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 58(4): 809-815 (2009) - [j18]Bryan C. Waltrip, Bo Gong, Thomas L. Nelson, Yicheng Wang, Charles J. Burroughs Jr., Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus:
AC Power Standard Using a Programmable Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 58(4): 1041-1048 (2009) - 2008
- [j17]Oliver F. Kieler, Regis Pinheiro Landim, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs Jr.:
AC-DC Transfer Standard Measurements and Generalized Compensation With the AC Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 57(4): 791-796 (2008) - [j16]Regis Pinheiro Landim, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs Jr.:
Systematic-Error Signals in the AC Josephson Voltage Standard: Measurement and Reduction. IEEE Trans. Instrum. Meas. 57(6): 1215-1220 (2008) - [j15]Charles J. Burroughs Jr., Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson:
Error and Transient Analysis of Stepwise-Approximated Sine Waves Generated by Programmable Josephson Voltage Standards. IEEE Trans. Instrum. Meas. 57(7): 1322-1329 (2008) - 2007
- [j14]Samuel P. Benz, Charles J. Burroughs Jr., Paul D. Dresselhaus, Norman F. Bergren, Thomas E. Lipe, Joseph R. Kinard, Yi-Hua Tang:
An AC Josephson Voltage Standard for AC-DC Transfer-Standard Measurements. IEEE Trans. Instrum. Meas. 56(2): 239-243 (2007) - [j13]Charles J. Burroughs Jr., Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson, Yonuk Chong, Jonathan M. Williams, Dale Henderson, Pravin Patel, Luis Palafox, Ralf Behr:
Development of a 60 Hz Power Standard Using SNS Programmable Josephson Voltage Standards. IEEE Trans. Instrum. Meas. 56(2): 289-294 (2007) - [j12]John R. Labenski, Wes Tew, Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs Jr.:
Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz. IEEE Trans. Instrum. Meas. 56(2): 481-485 (2007) - 2005
- [j11]Yonuk Chong, Charles J. Burroughs Jr., Paul D. Dresselhaus, Nicolas Hadacek, Hirotake Yamamori, Samuel P. Benz:
2.6-V high-resolution programmable Josephson voltage standard circuits using double-stacked MoSi2-barrier junctions. IEEE Trans. Instrum. Meas. 54(2): 616-619 (2005) - [j10]Charles J. Burroughs Jr., Samuel P. Benz, Paul D. Dresselhaus, Yonuk Chong:
Precision measurements of AC Josephson voltage standard operating margins. IEEE Trans. Instrum. Meas. 54(2): 624-627 (2005) - [j9]Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs Jr., Wes Tew, Rod White, John M. Martinis:
Progress on Johnson noise thermometry using a quantum voltage noise source for calibration. IEEE Trans. Instrum. Meas. 54(2): 653-657 (2005) - 2003
- [j8]Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, François P. M. Piquemal, Ralf Behr, Charles J. Burroughs Jr., Heikki Seppä:
Characterization of binary Josephson series arrays of different types at BNM-LNE and comparisons with conventional SIS arrays. IEEE Trans. Instrum. Meas. 52(2): 516-520 (2003) - [j7]Charles J. Burroughs Jr., Samuel P. Benz, Paul D. Dresselhaus:
AC Josephson voltage standard error measurements and analysis. IEEE Trans. Instrum. Meas. 52(2): 542-544 (2003) - 2001
- [j6]Samuel P. Benz, Charles J. Burroughs Jr., Paul D. Dresselhaus, L. A. Christina:
AC and DC voltages from a Josephson arbitrary waveform synthesizer. IEEE Trans. Instrum. Meas. 50(2): 181-184 (2001) - [j5]Blaise Jeanneret, Alain Rüfenacht, Charles J. Burroughs Jr.:
High precision comparison between SNS and SIS Josephson voltage standards. IEEE Trans. Instrum. Meas. 50(2): 188-191 (2001) - [j4]Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs Jr.:
Nanotechnology for next generation Josephson voltage standards. IEEE Trans. Instrum. Meas. 50(6): 1513-1518 (2001)
1990 – 1999
- 1999
- [j3]Samuel P. Benz, Clark A. Hamilton, Charles J. Burroughs Jr., Todd E. Harvey:
AC and DC bipolar voltage source using quantized pulses. IEEE Trans. Instrum. Meas. 48(2): 266-269 (1999) - [j2]Charles J. Burroughs Jr., Samuel P. Benz, Clark A. Hamilton, Todd E. Harvey:
Programmable 1 V dc voltage standard. IEEE Trans. Instrum. Meas. 48(2): 279-281 (1999) - [j1]Charles J. Burroughs Jr., Samuel P. Benz, Clark A. Hamilton, Todd E. Harvey, Joseph R. Kinard, Thomas E. Lipe, Hitoshi Sasaki:
Thermoelectric transfer difference of thermal converters measured with a Josephson source. IEEE Trans. Instrum. Meas. 48(2): 282-284 (1999)
Coauthor Index
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